References for Discharge Current Transient Spectroscopy (DCTS)

Fundamental Papers (Theoretical Consideratin and Experimental data)

1. A Graphical Peak Analysis Method for Determining Densities and Emission Rates of Traps in Dielectric Film from Transient Discharge Current

      Hideharu Matsuura, Takashi Hase, Yasuhiro Sekimoto, Masaharu Uchikura and Masaru Simizu:

      J. Appl. Phys. 91(2002)2085-2092. PDF file 132 kB

Experimental Data

Pb(Zr,Ti)O₃

1. A Graphical Peak Analysis Method for Determining Densities and Emission Rates of Traps in Dielectric Film from Transient Discharge Current

      Hideharu Matsuura, Takashi Hase, Yasuhiro Sekimoto, Masaharu Uchikura and Masaru Simizu:

      J. Appl. Phys. 91(2002)2085-2092. PDF file 132 kB

Sr₂Nb₂O₇

1. 7th International Conference on Properties and Applications of Dielectric Materials, Nagoya, Japan , June 1-5, 2003

      Formation and Characterization of Ferroelectric Sr₂Nb₂O₇ Thin Film for MFMIS-FET Type Non-Volatile Memory

      Yoshiaki Nakao, Yasuhiro Sekimoto, and Hideharu Matsuura  Proceeding 153 kB

SiN_x

1. Discharging current transient spectroscopy for evaluating traps in insulators

      Hideharu Matsuura, Masahiro Yoshimoto and Hiroyuki Matsunami

      Jpn. J. Appl. Phys. 34(1995)L185-L187. PDF file 551 KB

2. Increase of leakage current and trap densities caused by bias stress in silicon nitride prepared by photo-chemical vapor deposition

      Hideharu Matsuura, Masahiro Yoshimoto and Hiroyuki Matsunami:

      Jpn. J. Appl. Phys. 34(1995)L371-L374. PDF file 625 KB

Si

1. Investigation of Transient Reverse Currents in X-Ray detector Pin Diodes by Discharge Current Transient Spectroscopy

      Hideharu Matsuura and Kazushige Segawa:

      Jpn. J. Appl. Phys. 39(2000)178-179. PDF file 53kB

2. Difference between Traps Determined from Transient Capacitance and Transient Reverse Current

      Hideharu Matsuura, Kazushige Segawa and Tatsuya Ebisui:

      Jpn. J. Appl. Phys. 39(2000)2714-2715. PDF file 79kB

Theoretical Consideration

1. A simple graphical method for evaluating the polarization and relaxation times of dipoles or densities and energy levels of traps in a dielectric film from transient discharge current.

       Hideharu Matsuura

      Jpn. J. Appl. Phys. 36(1997)3569-3575. PDF file 1 MB

2. A simple graphical method for evaluating dipole relaxation time in dielectric

      Hideharu Matsuura:

      Jpn. J. Appl. Phys. 35(1996)2216-2217. PDF file 342 kB

3. Evaluating polarization in dielectrics with continuously distributed dipole relaxation time by discharge current transient spectroscopy

      Hideharu Matsuura:

      Jpn. J. Appl. Phys. 35(1996)4711-4712. PDF file 310 kB